A provider of complete, third-party technical support and brokering services for your beam tools including SEM, TEM and FIB tools. |
We service major brands of beam tools including those made by Hitachi, Zeiss/Leo, JEOL, FEI/Micrion, and Seiko SII. In addition to beam tools we also handle a wide variety of equipment widely used in semiconductor device fabrication such as sputters, RIE, CVD, RTA, and evaporators, etc. |
Global Nanotech Solutions specializes in used and refurbished scientific instruments and equipment.Welcome
Featured Products
Product | Type | Vintage | Key Features | Price |
|---|---|---|---|---|
| Cambridge StereoScan 360 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Cambridge StereoScan 360 Lab6 | Scanning Electron Microscope (SEM) | CALL | ||
| Camscan CS-44 W | Scanning Electron Microscope (SEM) | CALL | ||
| Camscan S2-80DV W | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-2300 W | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-4000 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-4160 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-4300 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-4500 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-570 W | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-6100 CFE CD | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-6200 CFE CD | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-800 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-8820 TFE CD | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-8840 TFE CD | Scanning Electron Microscope (SEM) | CALL | ||
| Hitachi S-900 CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Jeol JSM IC848A Lab6 | Scanning Electron Microscope (SEM) | CALL | ||
| Jeol JSM6600F CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Jeol JSM6700F CFE | Scanning Electron Microscope (SEM) | CALL | ||
| Jeol JWS7515 DR | Scanning Electron Microscope (SEM) | CALL |